Selahattin Sayil, Ph.D.




Selected Publications

  • Sayil, S., Lamichhane, S., Sayil, K. "Crosstalk Noise Mitigation using a Transmission Gate with Varied Gate Bias", Accepted for publication in Analog Integrated Circuits and Signal Processing, 2020.
  • Sayil, S., "A survey of circuit-level soft error mitigation methodologies", Analog Integrated Circuits and Signal Processing, vol.99, no. 1, pp. 63-70, April 2019.
  • Sayil, S. Contactless Measurement and Testing Techniques(Book Publication),  Springer Publishing, NY, 2018 (www.springer.com/us/book/9783319696720).
  • Sayil, S., Shah, A.H. , Zaman, ma, Islam, ma,"Soft Error Mitigation using Transmission Gate with varying Gate and Body Bias" (Journal Article), IEEE Design & Test, Volume 34, Issue: 1, pp. 47-56 , 2017.
  • Sayil, S., Bhowmik, P. “Mitigating the thermally induced single event crosstalk”, Analog Integrated Circuits and Signal Processing, vol. 92, no. 2, pp. 247–253, 2017.
  • Sayil, S., Soft Error Mechanisms, Modeling and Mitigation (Book Publication), Springer, New York, NY, 2016 (http://www.springer.com/us/book/9783319306063).
  • Sayil, S., Yao, Y., “Single Event Coupling Delay Estimation in Nanometer Technologies", Analog Integrated Circuits and Signal Processing, vol. 86, no:2, pp. 215-225, 2016.
  • Sayil, S., Yuan, Li, “Modeling Single Event Crosstalk Speedup in Nanometer Technologies”, Microelectronics Journal, Volume 46, Issue 5, pp. 343–35, May 2015
  • Sayil, S., Wang, J., “Coupling Induced Soft Error Mechanisms in Nanoscale CMOS technologies”, Analog Integrated Circuits and Signal Processing, Volume 79, Issue 1, pp. 115-126, April 2014.
  • Sayil, S., "Soft-Error-Aware Power Optimization Using Dynamic Threshold" (Book Chapter), in VLSI: Circuits for Emerging Applications, CRC Press, October 24, 2014, ISBN 9781466599093. 
  • Sayil, S., Wang, J. Yeddula, S. R., “Single Event Coupling Soft Errors in Nanoscale CMOS Circuits”, IEEE Design and Test, Volume 30, Issue: 6, pp. 1-9, December 2013.  
  • Sayil, S., Wang, J., “Single Event Soft Errors in CMOS Logic”, IEEE Potentials, Volume: 31, Issue: 2, Page(s): 15 – 22, 2012
  • Sayil, S., "Contactless Measurement and Testing Techniques"(Book Chapter), in Advanced Circuits for Emerging Technologies, Wiley,  2012 , ISBN-10: 0470900059
  • Sayil, S., Boorla, V.K.,Yeddula, S.R., “Modeling Single Event Crosstalk in Nanometer Technologies”, IEEE Transactions on Nuclear Science, Volume: 58 , Issue: 5 , Part: 2, pp. 2493 – 2502, 2011.
  • Sayil, S., Patel, N. B., “Soft Error and Soft Delay Mitigation using Dynamic Threshold Technique”, IEEE Transactions on Nuclear Science, Volume: 57, Issue: 6, Part: 1, Dec. 2010.

Education

  • Ph. D., Electrical and Computer Engineering, Vanderbilt University, Nashville, TN
  • M. Sc. Electrical and Computer Engineering, Pennsylvania State University, State College, PA
  • B. Sc. Electronics Ed., Gazi University, Turkey

Awards & Honors

  • Distinguished Faculty Teaching Fellow, Lamar University (2018-2021)
  • Associate Editor for International Journal of Electronics (2008-present) 
  • Corresponding Editor for IEEE Potentials (2008)
  • Research Enhancement Grant Awards obtained from Lamar University
  • Promoted to Department Chair position, Electronics & Computer Education Department, Pamukkale University, Denizli, Turkey, Feb 2001- May 2003.
  • Teaching and Research Assistantships awarded from Vanderbilt University (1999), (1998).
  • Graduated first in rank among the graduates of Gazi University Electronics Dept, Summer of 1990.
  • Ranked among top 1%(of 500,000) students in the nationwide B.Sc entrance exam, Turkey, 1986.