Selahattin Sayil, Ph.D.

Selected Publications

  • Sayil, S., Soft Error Mechanisms, Modeling and Mitigation (Book Publication), Springer, New York, NY, 2016 (
  • Sayil, S., "Soft-Error-Aware Power Optimization Using Dynamic Threshold" (Book Chapter), in VLSI: Circuits for Emerging Applications, CRC Press, October 24, 2014, ISBN 9781466599093. 
  • Sayil, S., "Contactless Measurement and Testing Techniques"(Book Chapter), in Advanced Circuits for Emerging Technologies, Wiley,  May 2012 , ISBN-10: 0470900059
  • Sayil, S., Shah, A.H. , Zaman, M.A., Islam, M.A.,"Soft Error Mitigation using Transmission Gate with varying Gate and Body Bias" (Journal Article), IEEE Design & Test, Volume 34, Issue: 1, pp. 47-56 , 2017.
  • Sayil, S., Yuan, Li, “Modeling Single Event Crosstalk Speedup in Nanometer Technologies” (Journal Article)Microelectronics Journal, Volume 46, Issue 5, pp. 343–35, May 2015.
  • Sayil, S., Wang, J. Yeddula, S. R., “Single Event Coupling Soft Errors in Nanoscale CMOS Circuits”, IEEE Design and Test, Volume 30, Issue: 6, pp. 1-9, December 2013.    


  • Ph. D., Electrical and Computer Engineering, Vanderbilt University, Nashville, TN
  • M. Sc. Electrical and Computer Engineering, Pennsylvania State University, State College, PA
  • B. Sc. Electronics Ed., Gazi University, Turkey

Awards & Honors

  • Associate Editor for International Journal of Electronics (2008-present) 
  • Corresponding Editor for IEEE Potentials (2008)
  • Nine (9) Research Enhancement Grant Awards obtained from Lamar University
  • Promoted to Department Chair position, Electronics & Computer Education Department, Pamukkale University, Denizli, TURKEY, Feb 2001- May 2003.
  • Received invitation letters from Harbin Institute of Technology, Harbin, China twice to develop Simulation Research Infrastructure of Space Environment (in 2012, and 2014)
  • Teaching and Research Assistantships awarded from Vanderbilt University (1999), (1998).
  • Graduated first in rank among the graduates of Gazi University Electronics Dept, Summer of 1990.
  • Ranked among top 2000 (of 500,000) students in the nationwide B.Sc entrance exam, Turkiye, 1986.